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Oral presentation

Investigation of buckling strength of snubber structure supporting piping system, 1; Buckling strength test by using snubber models

Abe, Masato; Moriizumi, Makoto; Ariga, Shinji*; Tsukimori, Kazuyuki

no journal, , 

Snubber is a kind of structures used for supporting piping systems. This structure moves smoothly by slow movements like thermal expansion of pipes, but it holds pipes strongly against rapid movements like earthquake. When the oil snubber is used in a plant, its length is adjusted by using an extended pipe. Therefore, its shape is relatively slender. Consequently, compression buckling due to seismic load should be prohibited in the design. In this paper the buckling behaviors obtained by the axial compression test using the snubber test models are described.

Oral presentation

Investigation of buckling strength of snubber structure supporting piping system, 2; Estimation of buckling strength of snubber structure

Tsukimori, Kazuyuki; Moriizumi, Makoto; Ariga, Shinji*; Abe, Masato

no journal, , 

Snubber is a kind of structures used for supporting piping systems. This structure moves smoothly by slow movements like thermal expansion of pipes, but it holds pipes strongly against rapid movements like earthquake. When the oil snubber is used in a plant, its length is adjusted by using an extended pipe. Therefore, its shape is relatively slender. Consequently, compression buckling due to seismic load should be prohibited in the design. In this paper the detailed analysis results of backing of the snubber test models and the evaluation method of this type of buckling are described.

Oral presentation

Troubleshooting of new injection shift-bump power supply of J-PARC RCS

Takayanagi, Tomohiro; Hayashi, Naoki; Kinsho, Michikazu; Ueno, Tomoaki*; Horino, Koki; Okabe, Kota; Irie, Yoshiro*

no journal, , 

New injection shift-bump (SB) power supply of the 3-GeV Rapid-Cycling Synchrotron (RCS) at Japan Proton Accelerator Research Complex (J-PARC) has been developed and manufactured. The power supply adopted a capacitor commutation method to form the trapezoid waveform pattern (bump waveform) at 32 kA peak by the Insulated Gate Bipolar transistor (IGBT) switch. However, in the test operation, the diodes of the DC charger for the capacitor in the Flat-top unit (Ft-unit) were frequently damaged. It is found the delay of the risetime for the current feedback loop is the cause of the overvoltage across the diodes. This paper reports the characteristic and troubleshooting of the SB power supply.

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